Basic Instrument Maneuvers
Instrument Flight
The most important element in performing a missed approach is to arrest your rate of descent and initiate
a climb as soon as possible. The procedure for executing a missed approach is as follows:
Throttle: MRT if required
Speed brakes: Retract
Pitch:
Maintain optimum AOA and rotate to approximately 10 to 12 degrees nose-up (do not
exceed optimum AOA)
Climb: Confirm on altimeter and VSI
Gear:
Raise with positive rate of climb
Flaps/slats: Up at 140 KIAS minimum (half at 125 KIAS minimum)
Missed approach call: Make (may be made simultaneously with power addition)
Airspeed (if remaining in pattern): 200 KIAS
Airspeed (if leaving pattern): 250 KIAS
Remember that you must comply with the controllers and/or published missed approach instructions.
PARTIAL PANEL MISSED APPROACH
Partial panel missed approach procedures are the same as full panel. As you rotate to on speed note the
attitude will be approximately five degrees higher on the STBY AI. Due to instrument lag, reference the
Baro Altimeter for level off and hold attitude as VSI stabilizes.
FLIGHT WITH PARTIAL PANEL
In the T-45A, partial panel flight consists of flying without the ADI. All flight maneuvers remain the same
whether you are flying under full or partial panel conditions. In the event that the ADI fails, you will have to
substitute the standby AI for the ADI and use the HSI for your heading reference.
The standby AI is smaller than the ADI and will not appear to move as smoothly, which may give rise to
the perception that the standby AI is more sensitive to control inputs than the ADI.
COMMON ERROR: As a result of the difference in size between the ADI and standby AI, your control of
the aircraft may be erratic. This will occur because the standby AI doesnt appear to respond to control
inputs in the same way the ADI does.
Substituting the standby for the ADI will require you to change your scan pattern.
Be careful not to fixate on the standby AI because of its unfamiliar location and the resulting change in you
scan pattern.
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